Gabe Arcuri sitting at Cameca LEAP 5000 XS. The Local Electrode Atom Probe (LEAP) 5000 XS from CAMECA Instruments Inc. is a high-resolution material analysis system that provides quantitative three-dimensional elemental and isotopic mapping with sub-nanometre resolution.
We've used some of the latest web technologies that your browser does not support. Some functionality might not work as expected. Try upgrading to one of our recommended browsers.